najoNanosystems: Physics, Chemistry, MathematicsНаносистемы: физика, химия, математика2220-80542305-7971Университет ИТМОnajo-1091Research ArticleCHEMISTRY AND MATERIALS SCIENCEХИМИЯ И НАУКА О МАТЕРИАЛАХElectrical properties of hot wall deposited PbTe–SnTe thin filmsIvanovV. A.

P. Brovka Street 19, 220072 Minsk.

vasil@physics.byGremenokV. F.

P. Brovka Street 19, 220072 Minsk.

SeidiH. G.

P. Brovka Street 19, 220072 Minsk.

ZiminS. P.

Sovetskaya Street 14, 150000 Yaroslavl.

zimin@uniyar.ac.ruGorlachevE. S.

Sovetskaya Street 14, 150000 Yaroslavl.

State Scientific and Production Association “Scientific-Practical Materials Research Centre of the National Academy of Sciences of BelarusBelarusYaroslavl State UniversityRussian Federation20131708202546816822Copyright © Ivanov V.A., Gremenok V.F., Seidi H.G., Zimin S.P., Gorlachev E.S., 20252025Ivanov V.A., Gremenok V.F., Seidi H.G., Zimin S.P., Gorlachev E.S.Ivanov V.A., Gremenok V.F., Seidi H.G., Zimin S.P., Gorlachev E.S.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://nanojournal.ifmo.ru/jour/article/view/1091

Polycrystalline Pb1−xSnxTe (0.0 ≤ x ≤ 1.0) telluride alloys were synthesized by the direct fusion technique. Thin films of these materials were prepared by a hot wall deposition method on glass substrates at Tsub =230–330 ◦C and in a vacuum of about 10−5 Torr. The microstructure of the films was characterized by XRD, SEM, EDX and AES. The films showed a natural cubic structure. The thin films’ microstructure consisted of densely packed grains with dimensions of 50–300 nm and crystallite growth direction is perpendicular to substrate plane. The as-grown Pb1−xSnxTe films showed p-type conductivity. Thermoelectric measurements of the films showed high values for the room-temperature Seebeck coefficient ranging, from 20 to 400 µV·K−1, for SnTe to PbTe thin films, respectively. The conductivity of the films was in the range of 3·101–1·104 Ω−1·cm−1.

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The authors declare that there are no conflicts of interest present.