najoNanosystems: Physics, Chemistry, MathematicsНаносистемы: физика, химия, математика2220-80542305-7971Университет ИТМО10.17586/2220-8054-2016-7-4-683-686najo-1333Research ArticleСтатьиCharacterization studies on the novel mixed thin filmsRamasundariP.RamasundariP.

P. G. & Research Department of Physics

Madurai

P. G. & Research Department of Physics

Madurai

GaneshanS.GaneshanS.

Department of Physics

Madurai

Department of Physics

Madurai

VijayalakshmiR.VijayalakshmiR.

P. G. & Research Department of Physics

Madurai

P. G. & Research Department of Physics

Madurai

S. V. N. CollegeИндияS. V. N. CollegeIndiaVivekananda CollegeИндияVivekananda CollegeIndiaThiagarajar. CollegeИндияThiagarajar. CollegeIndia20162208202574683686Copyright © Ramasundari P., Ganeshan S., Vijayalakshmi R., 20252025Ramasundari P., Ganeshan S., Vijayalakshmi R.Ramasundari P., Ganeshan S., Vijayalakshmi R.This work is licensed under a Creative Commons Attribution 4.0 License.https://nanojournal.ifmo.ru/jour/article/view/1333

Among electrochemical processes having a considerable impact on technical development, the mixed thin film (Mo-Ni oxide) plays an important role, due to its better mechanical, anticorrosive and thermal stability characteristics. The mixed films have been prepared by dip spin coating. The films are grown on substrates like Indium Tin Oxide (ITO) and are well adherent on the substrates, pinhole free and transparent. The X-ray diffraction analysis of the films confirms they are polycrystalline in nature. The morphological study reveals that the uniform distributions have flower-like structure. From the compositional analysis, the EDAX spectra show the presence of molybdenum and nickel. The optical band gap was found to be 1.36 eV and band assignments for Fourier Transform Infrared (FTIR) spectra are comparable to reported values.

Among electrochemical processes having a considerable impact on technical development, the mixed thin film (Mo-Ni oxide) plays an important role, due to its better mechanical, anticorrosive and thermal stability characteristics. The mixed films have been prepared by dip spin coating. The films are grown on substrates like Indium Tin Oxide (ITO) and are well adherent on the substrates, pinhole free and transparent. The X-ray diffraction analysis of the films confirms they are polycrystalline in nature. The morphological study reveals that the uniform distributions have flower-like structure. From the compositional analysis, the EDAX spectra show the presence of molybdenum and nickel. The optical band gap was found to be 1.36 eV and band assignments for Fourier Transform Infrared (FTIR) spectra are comparable to reported values.

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The authors declare that there are no conflicts of interest present.