najoNanosystems: Physics, Chemistry, MathematicsНаносистемы: физика, химия, математика2220-80542305-7971Университет ИТМО10.17586/2220-8054-2016-7-4-699-702najo-1339Research ArticleСтатьиTemperature influence study on copper selenide filmsTemperature influence study on copper selenide filmsRajendranV.RajendranV.

Department of Physics

Madurai 625234

Department of Physics

Madurai 625234

rajendran.vvc@gmail.comArulmozhi PackiaseeliS.Arulmozhi PackiaseeliS.

P. G. & Research Department of Physics

Madurai 625018

P. G. & Research Department of Physics

Madurai 625018

 

MuthumariS.MuthumariS.

P. G. & Research Department of Physics

Madurai 625009

P. G. & Research Department of Physics

Madurai 625009

VijayalakshmiR.VijayalakshmiR.

P. G. & Research Department of Physics

Madurai 625009

P. G. & Research Department of Physics

Madurai 625009

Vivekananda CollegeVivekananda CollegeFatima CollegeFatima CollegeThiagarajar. CollegeThiagarajar. College20162208202574699702Copyright © Rajendran V., Arulmozhi Packiaseeli S., Muthumari S., Vijayalakshmi R., 20252025Rajendran V., Arulmozhi Packiaseeli S., Muthumari S., Vijayalakshmi R.Rajendran V., Arulmozhi Packiaseeli S., Muthumari S., Vijayalakshmi R.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://nanojournal.ifmo.ru/jour/article/view/1339

Copper selenide was prepared by film is successfully deposited on a Fluorine-doped Tin Oxide (FTO) substrate by a brush plating technique. The film was uniform, had good adherence to the substrate and was annealed at 300 °C and 500 °C. As the annealing temperature increased, the orientation of the crystallites is more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicated that this film was crystalline in the structure.

Copper selenide was prepared by film is successfully deposited on a Fluorine-doped Tin Oxide (FTO) substrate by a brush plating technique. The film was uniform, had good adherence to the substrate and was annealed at 300 °C and 500 °C. As the annealing temperature increased, the orientation of the crystallites is more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicated that this film was crystalline in the structure.

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The authors declare that there are no conflicts of interest present.