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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">najo</journal-id><journal-title-group><journal-title xml:lang="en">Nanosystems: Physics, Chemistry, Mathematics</journal-title><trans-title-group xml:lang="ru"><trans-title>Наносистемы: физика, химия, математика</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-8054</issn><issn pub-type="epub">2305-7971</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2220-8054-2025-16-6-770-777</article-id><article-id custom-type="elpub" pub-id-type="custom">najo-1616</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>PHYSICS</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ФИЗИКА</subject></subj-group></article-categories><title-group><article-title>Effect of nanoscale water media confinement on the approach curve in SICM</article-title><trans-title-group xml:lang="ru"><trans-title>Влияние наномасштабного конфайнмента водной среды на кривую подвода в сканирующей микроскопии ионной проводимости</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-5356-1261</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Лукашенко</surname><given-names>С. Ю.</given-names></name><name name-style="western" xml:lang="en"><surname>Lukashenko</surname><given-names>S. Yu.</given-names></name></name-alternatives><bio xml:lang="en"><p>Stanislav Yu. Lukashenko</p></bio><email xlink:type="simple">lukashenko13@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-7054-6602</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Горбенко</surname><given-names>О. М.</given-names></name><name name-style="western" xml:lang="en"><surname>Gorbenko</surname><given-names>O. M.</given-names></name></name-alternatives><bio xml:lang="en"><p>Olga M. Gorbenko</p></bio><email xlink:type="simple">gorolga64@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8677-061X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Фельштын</surname><given-names>М. Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Felshtyn</surname><given-names>M. L.</given-names></name></name-alternatives><bio xml:lang="en"><p>Mikhail L. Felshtyn</p></bio><email xlink:type="simple">mfelsztyn@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-2575-5015</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Сапожников</surname><given-names>И. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Sapozhnikov</surname><given-names>I. D.</given-names></name></name-alternatives><bio xml:lang="en"><p>Ivan D. Sapozhnikov</p></bio><email xlink:type="simple">isapojnikov@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-8578-5200</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Пичахчи</surname><given-names>С. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Pichakhchi</surname><given-names>S. V.</given-names></name></name-alternatives><bio xml:lang="en"><p>Stepan V. Pichakhchi</p></bio><email xlink:type="simple">pichakhchi.s@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-3361-6947</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Жуков</surname><given-names>М. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Zhukov</surname><given-names>M. V.</given-names></name></name-alternatives><bio xml:lang="en"><p>Mikhail V. Zhukov</p></bio><email xlink:type="simple">cloudjyk@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-9970-9172</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Голубок</surname><given-names>А. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Golubok</surname><given-names>A. O.</given-names></name></name-alternatives><bio xml:lang="en"><p>Alexander O. Golubok</p></bio><email xlink:type="simple">aogolubok@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="en" id="aff-1"><institution>Institute for Analytical Instrumentation of the Russian Academy of Sciences</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>06</day><month>01</month><year>2026</year></pub-date><volume>16</volume><issue>6</issue><fpage>770</fpage><lpage>777</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Lukashenko S.Y., Gorbenko O.M., Felshtyn M.L., Sapozhnikov I.D., Pichakhchi S.V., Zhukov M.V., Golubok A.O., 2026</copyright-statement><copyright-year>2026</copyright-year><copyright-holder xml:lang="ru">Лукашенко С.Ю., Горбенко О.М., Фельштын М.Л., Сапожников И.Д., Пичахчи С.В., Жуков М.В., Голубок А.О.</copyright-holder><copyright-holder xml:lang="en">Lukashenko S.Y., Gorbenko O.M., Felshtyn M.L., Sapozhnikov I.D., Pichakhchi S.V., Zhukov M.V., Golubok A.O.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://nanojournal.ifmo.ru/jour/article/view/1616">https://nanojournal.ifmo.ru/jour/article/view/1616</self-uri><abstract><p>The features of the ion current dependence on distance when a glass nanopipette with an aperture diameter of ∼100 nm approaches the surface of a solid dielectric in a scanning ion conductivity microscope have been studied. A characteristic peak in the approach curve has been observed when the electrode in the nanopipette with an electrolyte is negatively biased relative to electrode in the bath, while a monotonic current decline occurs with a positive bias. To explain this unusual behavior of the ion current, the model accounting for the overlap of electric double layers and water confinement phenomenon in nanochannels and nanogaps have been proposed. The model demonstrates good agreement with the experimental data and provides a basis for quantitative assessment of surface charge at electrolyte–solid interfaces with nanometer-scale spatial sensitivity.</p></abstract><trans-abstract xml:lang="ru"><p>Исследованы особенности на зависимости ионного тока от расстояния при сближении стеклянной нанопипетки с диаметром апертуры ~100 нм к поверхности твердого диэлектрика в сканирующем микроскопе ионной проводимости. При положительном смещении потенциала электрода, расположенного в нанопипетке, относительно электрода, расположенного в чашке происходит монотонное снижение тока, однако при отрицательном смещении на кривой подвода наблюдается характерный пик. Для объяснения этого необычного поведения предложена модель, учитывающая перекрытие электрических двойных слоев и явление конфайнмента водной среды в наноканалах и нанозазорах. Модель демонстрирует хорошее согласие с экспериментальными данными и обеспечивает основу для количественной оценки поверхностного заряда на границе раздела электролит–твердое тело с наномасштабной пространственной чувствительностью.</p><p> </p></trans-abstract><kwd-group xml:lang="ru"><kwd>Наномасштабный конфайнмент воды</kwd><kwd>нанопора</kwd><kwd>пик-эффект</kwd><kwd>уравнения Пуассона–Нернста–Планка</kwd><kwd>поверхностная плотность заряда</kwd></kwd-group><kwd-group xml:lang="en"><kwd>nanoscale water confinement</kwd><kwd>nanopore</kwd><kwd>peak-effect</kwd><kwd>Poisson–Nernst–Planck equations</kwd><kwd>surface charge density</kwd></kwd-group><funding-group><funding-statement xml:lang="en">This work is supported by the Ministry of Science and Higher Education of the Russian Federation (Project No. 075-00444-25-00, dated 26.12.2024) and by the Russian Science Foundation (Project No. 24-79-00169.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Hansma P.K., Drake B., Marti O., Gould S.A., Prater C.B. 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