<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">najo</journal-id><journal-title-group><journal-title xml:lang="en">Nanosystems: Physics, Chemistry, Mathematics</journal-title><trans-title-group xml:lang="ru"><trans-title>Наносистемы: физика, химия, математика</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-8054</issn><issn pub-type="epub">2305-7971</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2220-8054-2018-9-2-295-299</article-id><article-id custom-type="elpub" pub-id-type="custom">najo-711</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>CHEMISTRY AND MATERIALS SCIENCE</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ХИМИЯ И НАУКА О МАТЕРИАЛАХ</subject></subj-group></article-categories><title-group><article-title>Spontaneous growth of petal crystals in fullerite films</article-title><trans-title-group xml:lang="ru"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Baran</surname><given-names>L. V.</given-names></name></name-alternatives><bio xml:lang="en"><p>Nezavisimosti ave., 4, Minsk, 220030</p></bio><email xlink:type="simple">baran@bsu.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="en">Belarusian State University<country>Belarus</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>12</day><month>08</month><year>2025</year></pub-date><volume>9</volume><issue>2</issue><elocation-id>295–299</elocation-id><permissions><copyright-statement>Copyright &amp;#x00A9; Baran L.V., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Baran L.V.</copyright-holder><copyright-holder xml:lang="en">Baran L.V.</copyright-holder><license license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://nanojournal.ifmo.ru/jour/article/view/711">https://nanojournal.ifmo.ru/jour/article/view/711</self-uri><abstract><p>Changes in the structure, elemental and phase compositions of fullerite films after their storage in air are investigated by scanning electronic microscopy, atomic force microscopy, X-ray spectroscopic microanalysis, X-ray diffraction, and Raman spectroscopy. The formation of the petal and flower-like fullerite crystals under the action of internal stress is established.</p></abstract><kwd-group xml:lang="en"><kwd>fullerite</kwd><kwd>petal crystals</kwd><kwd>films</kwd><kwd>structure</kwd></kwd-group><funding-group xml:lang="en"><funding-statement>The author expresses gratitude to O.V. Korolik and S.V. Zlotskiyi for conducting the films researches by the Raman spectroscopy method and the X-ray diffraction analysis accordingly.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Fischer J.E. Structure and dynamics of solid C60 and its intercalation compounds. Mat. Sci. Eng., 1999, B19, P. 90–99.</mixed-citation><mixed-citation xml:lang="en">Fischer J.E. Structure and dynamics of solid C60 and its intercalation compounds. Mat. Sci. 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