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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">najo</journal-id><journal-title-group><journal-title xml:lang="en">Nanosystems: Physics, Chemistry, Mathematics</journal-title><trans-title-group xml:lang="ru"><trans-title>Наносистемы: физика, химия, математика</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-8054</issn><issn pub-type="epub">2305-7971</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">najo-728</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>CHEMISTRY AND MATERIALS SCIENCE</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ХИМИЯ И НАУКА О МАТЕРИАЛАХ</subject></subj-group></article-categories><title-group><article-title>The influence of substrate material on the resistance of composite films based on reduced graphene oxide and polystyrene</article-title><trans-title-group xml:lang="ru"><trans-title></trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Nikolaeva</surname><given-names>M. N.</given-names></name></name-alternatives><bio xml:lang="en"><p>Bolshoy pr. 31, 199004 St. Petersburg</p></bio><email xlink:type="simple">marianna_n@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Gushchina</surname><given-names>E. V.</given-names></name></name-alternatives><bio xml:lang="en"><p>Politekhnicheskaya ul. 26, 194021 St. Petersburg</p></bio><email xlink:type="simple">katgushch@yandex.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Dunaevskii</surname><given-names>M. S.</given-names></name></name-alternatives><bio xml:lang="en"><p>Politekhnicheskaya ul. 26, 194021 St. Petersburg</p></bio><email xlink:type="simple">Mike.Dunaeffsky@mail.ioffe.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Dideikin</surname><given-names>A. T.</given-names></name></name-alternatives><bio xml:lang="en"><p>Politekhnicheskaya ul. 26, 194021 St. Petersburg</p></bio><email xlink:type="simple">dideikin@mail.ioffe.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Bugrov</surname><given-names>A. N.</given-names></name></name-alternatives><bio xml:lang="en"><p>Bolshoy pr. 31, 199004 St. Petersburg</p><p>ul. Professora Popova 5, 197376 St. Petersburg</p></bio><email xlink:type="simple">alexander.n.bugrov@gmail.com</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="western" xml:lang="en"><surname>Anan’eva</surname><given-names>T. D.</given-names></name></name-alternatives><bio xml:lang="en"><p>Bolshoy pr. 31, 199004 St. Petersburg</p></bio><email xlink:type="simple">anthracene@hq.macro.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="en" id="aff-1"><institution>Institute of macromolecular compounds RAS</institution><country>Russian Federation</country></aff><aff xml:lang="en" id="aff-2"><institution>Ioffe Institute RAS</institution><country>Russian Federation</country></aff><aff xml:lang="en" id="aff-3"><institution>Institute of macromolecular compounds RAS; Saint Petersburg Electrotechnical University “LETI”</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>12</day><month>08</month><year>2025</year></pub-date><volume>8</volume><issue>5</issue><fpage>665</fpage><lpage>669</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Nikolaeva M.N., Gushchina E.V., Dunaevskii M.S., Dideikin A.T., Bugrov A.N., Anan’eva T.D., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Nikolaeva M.N., Gushchina E.V., Dunaevskii M.S., Dideikin A.T., Bugrov A.N., Anan’eva T.D.</copyright-holder><copyright-holder xml:lang="en">Nikolaeva M.N., Gushchina E.V., Dunaevskii M.S., Dideikin A.T., Bugrov A.N., Anan’eva T.D.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://nanojournal.ifmo.ru/jour/article/view/728">https://nanojournal.ifmo.ru/jour/article/view/728</self-uri><abstract><p>Current and surface topographies of composite based on polystyrene with reduced graphene oxide were investigated using atomic force microscopy. Different substrates such as gold, silicon and graphite were used for this purpose. The strong influence of the substrate’s nature on the current distribution map I(x; y) and the currentvoltage characteristics was observed. This effect can be related to different adhesion of composite on the investigated substrates.</p></abstract><kwd-group xml:lang="en"><kwd>reduced graphene oxide</kwd><kwd>polystyrene</kwd><kwd>composite</kwd><kwd>resistance</kwd><kwd>atomic force microscopy</kwd></kwd-group><funding-group><funding-statement xml:lang="en">We are grateful to Alexander N. Ionov and to Leonid N. Ionov (Ioffe Institute) for useful discussion and for gold substrate preparation. A. T. Dideikin acknowledges RFBR, grant 150205153, for support.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Rani A., Nam S., et.al. 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