najoNanosystems: Physics, Chemistry, MathematicsНаносистемы: физика, химия, математика2220-80542305-7971Университет ИТМО10.17586/2220-8054-2019-10-6-642-653najo-820Research ArticleCHEMISTRY AND MATERIALS SCIENCEХИМИЯ И НАУКА О МАТЕРИАЛАХOn the accuracy of the probe-sample contact stiffness measured by an atomic force microscopeOn the accuracy of the probe-sample contact stiffness measured by an atomic force microscopeAnkudinovА. V.AnkudinovA. V.

26 Politekhnicheskaya, Saint-Petersburg 194021

26 Politekhnicheskaya, Saint-Petersburg 194021

Alexander.ankudinov@mail.ioffe.ruIoffe InstituteIoffe Institute201913082025106642653Copyright © Ankudinov A.V., 20252025Ankudinov А.V.Ankudinov A.V.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://nanojournal.ifmo.ru/jour/article/view/820

To improve the accuracy of atomic force microscopy in nanomechanical experiments, an analytical model is proposed to study the static interaction of a cantilever in contact with a sample. The model takes into account: the cantilever probe is clamped by the sample or slides along its surface, the geometric and mechanical characteristics of the sample and the cantilever, their relative orientation. The cantilever console bending and torsion angles as functions of the sample displacements in three orthogonal directions have been measured by atomic force microscopy with an optical beam deflection scheme.The measurements are in good agreement with the simulation.

To improve the accuracy of atomic force microscopy in nanomechanical experiments, an analytical model is proposed to study the static interaction of a cantilever in contact with a sample. The model takes into account: the cantilever probe is clamped by the sample or slides along its surface, the geometric and mechanical characteristics of the sample and the cantilever, their relative orientation. The cantilever console bending and torsion angles as functions of the sample displacements in three orthogonal directions have been measured by atomic force microscopy with an optical beam deflection scheme.The measurements are in good agreement with the simulation.

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The authors declare that there are no conflicts of interest present.