najoNanosystems: Physics, Chemistry, MathematicsНаносистемы: физика, химия, математика2220-80542305-7971Университет ИТМО10.17586/2220-8054-2016-7-6-1002-1009najo-837Research ArticlePHYSICSФИЗИКАAssessment for applicability of the “tangent technique” in X-ray small-angle scatteringSmirnovA. V.

49, Kronverkskiy, St. Petersburg, 197101

borfedorov1@gmail.comKalyakinV. Yu.

49, Kronverkskiy, St. Petersburg, 197101

smirnav_2@mail.ruFedorovB. A.

49, Kronverkskiy, St. Petersburg, 197101

slav.yrich@gmail.comITMO UniversityRussian Federation2016130820257610021009Copyright © Smirnov A.V., Kalyakin V.Y., Fedorov B.A., 20252025Smirnov A.V., Kalyakin V.Y., Fedorov B.A.Smirnov A.V., Kalyakin V.Y., Fedorov B.A.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://nanojournal.ifmo.ru/jour/article/view/837

A number of simple model systems are used to examine the applicability of the “tangent technique”, employed in the small-angle X-ray scattering for estimating the particle size distribution function, as well as to ascertain the relative contributions of the scattering intensity by differently sized particles to the total scattering intensity. The undertaken analysis has shown that, even in the most favorable case-an ensemble of two groups of different-size particles-the “tangent technique” cannot be used either to find the particle size proper, or to ascertain the relative contributions of individual groups to the total scattering intensity.

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The authors declare that there are no conflicts of interest present.