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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">najo</journal-id><journal-title-group><journal-title xml:lang="en">Nanosystems: Physics, Chemistry, Mathematics</journal-title><trans-title-group xml:lang="ru"><trans-title>Наносистемы: физика, химия, математика</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-8054</issn><issn pub-type="epub">2305-7971</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2220-8054-2016-7-1-214-219</article-id><article-id custom-type="elpub" pub-id-type="custom">najo-967</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>PAPERS, PRESENTED AT THE CONFERENCE</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>PAPERS, PRESENTED AT THE CONFERENCE</subject></subj-group></article-categories><title-group><article-title>Electrophysical properties of shungites at low temperatures</article-title><trans-title-group xml:lang="ru"><trans-title>Electrophysical properties of shungites at low temperatures</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Moshnikov</surname><given-names>I. A.</given-names></name><name name-style="western" xml:lang="en"><surname>Moshnikov</surname><given-names>I. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Petrozavodsk</p></bio><bio xml:lang="en"><p>Petrozavodsk</p></bio><email xlink:type="simple">igorm@krc.karelia.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Kovalevski</surname><given-names>V. V.</given-names></name><name name-style="western" xml:lang="en"><surname>Kovalevski</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Petrozavodsk</p></bio><bio xml:lang="en"><p>Petrozavodsk</p></bio><email xlink:type="simple">kovalevs@krc.karelia.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Institute of Geology, Karelian Research Center, RAS</institution></aff><aff xml:lang="en"><institution>Institute of Geology, Karelian Research Center, RAS</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2016</year></pub-date><pub-date pub-type="epub"><day>14</day><month>08</month><year>2025</year></pub-date><volume>7</volume><issue>1</issue><issue-title>Special Issue: Proceedings of the 12th Biennial International Conference “Advanced Carbon Nanostructures” (ACNS’2015)</issue-title><fpage>214</fpage><lpage>219</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Moshnikov I.A., Kovalevski V.V., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Moshnikov I.A., Kovalevski V.V.</copyright-holder><copyright-holder xml:lang="en">Moshnikov I.A., Kovalevski V.V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://nanojournal.ifmo.ru/jour/article/view/967">https://nanojournal.ifmo.ru/jour/article/view/967</self-uri><abstract><p>The temperature dependence of electrical conductivity and the shielding effectiveness of shungites have been studied at temperatures ranging from 77 to 300 K. The idiosyncrasies of temperature dependences for measuring electrical parameters were determined. Correlations of the π + σ plasmon energies with changes in the frequency dependence of shielding effectiveness on temperature were determined.</p></abstract><trans-abstract xml:lang="ru"><p>The temperature dependence of electrical conductivity and the shielding effectiveness of shungites have been studied at temperatures ranging from 77 to 300 K. The idiosyncrasies of temperature dependences for measuring electrical parameters were determined. Correlations of the π + σ plasmon energies with changes in the frequency dependence of shielding effectiveness on temperature were determined.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>shungite rocks</kwd><kwd>carbon</kwd><kwd>shielding effectiveness</kwd><kwd>electrical conductivity</kwd></kwd-group><kwd-group xml:lang="en"><kwd>shungite rocks</kwd><kwd>carbon</kwd><kwd>shielding effectiveness</kwd><kwd>electrical conductivity</kwd></kwd-group><funding-group><funding-statement xml:lang="en">This work supported in part by the RFBR grant 13-05-98811.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Kovalevski V.V. Shungite or higher anthraxolite? Zapiski RMO, 2009, 5, P. 97–105.</mixed-citation><mixed-citation xml:lang="en">Kovalevski V.V. Shungite or higher anthraxolite? 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