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Наносистемы: физика, химия, математика

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Optical and structural studies of vanadium pentoxide thin films

https://doi.org/10.17586/2220-8054-2016-7-4-687-690

Аннотация

Recently, transition metal oxides like Vanadium pentoxide have become a subject of intensive studies. The particular physical and chemical properties of these materials allow a wide range of practical applications such as electrochromic devices, cathode electrodes for lithium batteries, humidity sensors. The V2O5 film was prepared by an electrodeposition technique. The structural and optical properties were studied by X- Ray Diffraction (XRD), scanning electron microscopy (SEM), UV-Visible and Fourier Transform Infrared Spectroscopy (FT-IR). XRD spectra recorded has been observed and compared with the JCPDS values.  SEM images showed very smooth surface morphology and the elemental compositions of the film were confirmed by EDAX. The transmittance of the V2O5 films showed 75 % at 425 nm for the as-deposited substrate. The energy band gap of the films was found to be 2.45 eV and the band assignments of the V2O5 film are comparable with the reported values.

Об авторах

S. Ganeshan
Vivekananda College
Индия

Department of Physics

Madurai



P. Ramasundari
S. V. N. College
Индия

P. G. & Research Department of Physics

Madurai



A. Elangovan
Thiagarajar College
Индия

P. G. & Research Department of Chemistry

Madurai



R. Vijayalakshmi
Thiagarajar College
Индия

P. G. & Research Department of Physics

Madurai



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Рецензия

Для цитирования:


Ganeshan S., Ramasundari P., Elangovan A., Vijayalakshmi R. Optical and structural studies of vanadium pentoxide thin films. Наносистемы: физика, химия, математика. 2016;7(4):687-690. https://doi.org/10.17586/2220-8054-2016-7-4-687-690

For citation:


Ganeshan S., Ramasundari P., Elangovan A., Vijayalakshmi R. Optical and structural studies of vanadium pentoxide thin films. Nanosystems: Physics, Chemistry, Mathematics. 2016;7(4):687-690. https://doi.org/10.17586/2220-8054-2016-7-4-687-690

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ISSN 2220-8054 (Print)
ISSN 2305-7971 (Online)