Structural, optical and morphological study of tungsten selenide thin films
https://doi.org/10.17586/2220-8054-2016-7-4-703-706
Abstract
Tungsten selenide (WSe2) film was successfully deposited on FTO substrate by brush plating technique. The film was uniform and well adherent to the substrate and annealed to 300 ℃ and 500 ℃. As the annealing temperature was increased the orientation of the crystallites was more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicates that this film was crystallized in the hexagonal structure.
About the Authors
S. Arulmozhi Packiaseeli
Fatima College
India
India
P.G. & Research Department of Physics
Madurai
V. Rajendran
Vivekananda College
India
India
Department of Physics
Madurai
R. Vijayalakshmi
Thiagarajar. College
India
India
P.G. & Research Department of Physics
Madurai
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Review
For citations:
Arulmozhi Packiaseeli S., Rajendran V., Vijayalakshmi R. Structural, optical and morphological study of tungsten selenide thin films. Nanosystems: Physics, Chemistry, Mathematics. 2016;7(4):703-706. https://doi.org/10.17586/2220-8054-2016-7-4-703-706
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