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Vol 12, No 3 (2021) Ultraviolet and visible reflective TiO2/SiO2 thin films on silicon using sol-gel spin coater Abstract  PDF (Eng)  similar documents
S. Saravanan, R. S. Dubey
"... . The multilayer film thickness was calculated at 109 and 151 nm at two and four stacks by a surface profilometer ..."
 
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