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Topograms production with use of pulsed teraherz reflectometer

Abstract

   It has been considered the possibilities of the experimental setup for temporary registration form of pulsed THz radiation reflected from objects (THz reflectometer) for pulsed terahertz imaging reflectometry and tomography, the visualization of internal objects structures which are transparent in the THz frequency range. It has been received two- and three-dimensional topograms test object and defined resolution limit of the method. It has been found that the space-time registration form of the reflected pulses can effectively generate topograms of surfaces with relief depth ranging from 1 to 1000 microns.

About the Authors

M. S. Kulya
Saint Petersburg National Research University of Information Technologies, Mechanics and Optics
Russian Federation

Maksim Kulya, postgraduate, research engineer, Master of Science

Saint Petersburg



Ya. V. Grachev
Saint Petersburg National Research University of Information Technologies, Mechanics and Optics
Russian Federation

Yaroslav Grachev, postgraduate, research engineer, Master of Science

Saint Petersburg



V. G. Bespalov
Saint Petersburg National Research University of Information Technologies, Mechanics and Optics
Russian Federation

Victor Bespalov, Doctor of Science, Professor

Saint Petersburg



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Review

For citations:


Kulya M.S., Grachev Ya.V., Bespalov V.G. Topograms production with use of pulsed teraherz reflectometer. Nanosystems: Physics, Chemistry, Mathematics. 2012;3(5):33-41. (In Russ.)

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