Young’s modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation
https://doi.org/10.17586/2220-8054-2021-12-1-118-127
Abstract
Ni3Si2O5(OH)4 phyllosilicate nanoscrolls were investigated by two techniques: the bending-based test method of AFM and the indentation method with visual control in STEM. In the first case, the average measured Young’s modulus, about 200 GPa, turned out to be significantly higher than in the second one, 40 GPa. The reasons for this discrepancy are analyzed.
Supporting agencies: This work was supported by the Russian Science Foundation grant 19-13-00151. An access to the Libra 200 TEM and Hysitron PI-95 in-situ picoindenter was provided by the M.V. Lomonosov Moscow State University Program of Development.
About the Authors
M. M. Khalisov
Ioffe Institute; Pavlov Institute of Physiology, Russian Academy of Sciences
Russian Federation
Russian Federation
Politekhnicheskaya, 26, Saint-Petersburg 194021; Makarova emb., 6, Saint-Petersburg, 199034
V. A. Lebedev
University of Limerick
Ireland
Ireland
Limerick, V94 T9PX
A. S. Poluboyarinov
Lomonosov Moscow State University
Russian Federation
Russian Federation
GSP-1, Leninskie Gory, Moscow, 119991
A. V. Garshev
Lomonosov Moscow State University
Russian Federation
Russian Federation
GSP-1, Leninskie Gory, Moscow, 119991
E. K. Khrapova
Ioffe Institute
Russian Federation
Russian Federation
Politekhnicheskaya, 26, Saint-Petersburg 194021
A. A. Krasilin
Ioffe Institute
Russian Federation
Russian Federation
Politekhnicheskaya, 26, Saint-Petersburg 194021
A. V. Ankudinov
Ioffe Institute
Russian Federation
Russian Federation
Politekhnicheskaya, 26, Saint-Petersburg 194021
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For citations:
Khalisov M.M., Lebedev V.A., Poluboyarinov A.S., Garshev A.V., Khrapova E.K., Krasilin A.A., Ankudinov A.V. Young’s modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation. Nanosystems: Physics, Chemistry, Mathematics. 2021;12(1):118-127. https://doi.org/10.17586/2220-8054-2021-12-1-118-127
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