Для цитирования:

 ,  ,  ,  ,  ,   . Наносистемы: физика, химия, математика. 2021;12(6):783-791. https://doi.org/10.17586/2220-8054-2021-12-6-783-791

For citation:

Illarionov G.A., Kolchanov D.S., Chrishtop V.V., Kasatkin I.A., Vinogradov A.V., Morozov M.I. Study of the resistive switching and electrode degradation in Al/TiO₂/FTO thin films upon thermal treatment in reducing atmosphere. Nanosystems: Physics, Chemistry, Mathematics. 2021;12(6):783-791. https://doi.org/10.17586/2220-8054-2021-12-6-783-791