Methodology of analyzing the CdSe semiconductor quantum dots parameters
https://doi.org/10.17586/2220-8054-2018-9-4-464-467
Аннотация
Direct methods (using a laser particle size analyzer) and indirect (from the analysis of spectral characteristics and differential normalized tunnel CVC) methods of CdSe QD size estimation allowed determination of the size (4 – 5 nm) and shown good qualitative and quantitative agreement of the results with an error of less than 10 %. It is concluded that the tunnel differential CVC analysis is an effective method for express measurement that can be used in quantum-size object investigations.
Об авторах
A. Mikhailov
Saratov State University
Россия
Россия
V. Kabanov
Saratov State University
Россия
Россия
E. Glukhovskoy
Saratov State University
Россия
Россия
M. Shishkin
Saratov State University
Россия
Россия
M. Gavrikov
Saratov State University
Россия
Россия
Список литературы
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Рецензия
Для цитирования:
, , , , . Наносистемы: физика, химия, математика. 2018;9(4):464-467. https://doi.org/10.17586/2220-8054-2018-9-4-464-467
For citation:
Mikhailov A.I., Kabanov V.F., Glukhovskoy E.G., Shishkin M.I., Gavrikov M.V. Methodology of analyzing the CdSe semiconductor quantum dots parameters. Nanosystems: Physics, Chemistry, Mathematics. 2018;9(4):464-467. https://doi.org/10.17586/2220-8054-2018-9-4-464-467
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