On the accuracy of the probe-sample contact stiffness measured by an atomic force microscope
https://doi.org/10.17586/2220-8054-2019-10-6-642-653
Abstract
To improve the accuracy of atomic force microscopy in nanomechanical experiments, an analytical model is proposed to study the static interaction of a cantilever in contact with a sample. The model takes into account: the cantilever probe is clamped by the sample or slides along its surface, the geometric and mechanical characteristics of the sample and the cantilever, their relative orientation. The cantilever console bending and torsion angles as functions of the sample displacements in three orthogonal directions have been measured by atomic force microscopy with an optical beam deflection scheme.The measurements are in good agreement with the simulation.
Supporting agencies: The author thanks his colleagues, Dr. M. M. Khalisov and Dr. A. A. Krasilin for constructive criticism of the manuscript
About the Author
A. V. Ankudinov
Ioffe Institute
Russian Federation
Russian Federation
26 Politekhnicheskaya, Saint-Petersburg 194021
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Review
For citations:
Ankudinov A.V. On the accuracy of the probe-sample contact stiffness measured by an atomic force microscope. Nanosystems: Physics, Chemistry, Mathematics. 2019;10(6):642-653. https://doi.org/10.17586/2220-8054-2019-10-6-642-653
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