Для цитирования:

Ankudinov А.V. On the accuracy of the probe-sample contact stiffness measured by an atomic force microscope. Наносистемы: физика, химия, математика. 2019;10(6):642-653. https://doi.org/10.17586/2220-8054-2019-10-6-642-653

For citation:

Ankudinov A.V. On the accuracy of the probe-sample contact stiffness measured by an atomic force microscope. Nanosystems: Physics, Chemistry, Mathematics. 2019;10(6):642-653. https://doi.org/10.17586/2220-8054-2019-10-6-642-653