Utilizing of the medium-energy ion scattering spectrometry for the composition investigation of graphene oxide films on silicon surface

V. V. Afrosimov; A. T. Dideykin; V. I. Sakharov; I. T. Serenkov; S. P. Vul

Nanosystems: Physics, Chemistry, Mathematics

ISSN 2220-8054 (Print)
ISSN 2305-7971 (Online)

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Afrosimov V.V., Dideykin A.T., Sakharov V.I., Serenkov I.T., Vul S.P. Utilizing of the medium-energy ion scattering spectrometry for the composition investigation of graphene oxide films on silicon surface. Nanosystems: Physics, Chemistry, Mathematics. 2014;5(1):113-116.

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ISSN 2220-8054 (Print)
ISSN 2305-7971 (Online)

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About the Authors

V. V. Afrosimov
Ioffe Physical-Technical Institute of the Russian Academy of Sciences
Russian Federation

Moscow

A. T. Dideykin
Ioffe Physical-Technical Institute of the Russian Academy of Sciences
Russian Federation

Moscow

V. I. Sakharov
Ioffe Physical-Technical Institute of the Russian Academy of Sciences
Russian Federation

Moscow

I. T. Serenkov
Ioffe Physical-Technical Institute of the Russian Academy of Sciences
Russian Federation

Moscow

S. P. Vul
Ioffe Physical-Technical Institute of the Russian Academy of Sciences
Russian Federation

Moscow

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