Для цитирования:

 ,  ,  ,  ,   . Наносистемы: физика, химия, математика. 2014;5(1):113-116.

For citation:

Afrosimov V.V., Dideykin A.T., Sakharov V.I., Serenkov I.T., Vul S.P. Utilizing of the medium-energy ion scattering spectrometry for the composition investigation of graphene oxide films on silicon surface. Nanosystems: Physics, Chemistry, Mathematics. 2014;5(1):113-116.