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NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2021, 12 (1), P. 118–127

Young’s modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation

M. M. Khalisov – Ioffe Institute Politekhnicheskaya, 26, Saint-Petersburg 194021; Pavlov Institute of Physiology, Russian Academy of Sciences, Makarova emb., 6, Saint-Petersburg, 199034, Russian Federation
V. A. Lebedev – University of Limerick Limerick, V94 T9PX, Ireland
A. S. Poluboyarinov – Lomonosov Moscow State University GSP-1, Leninskie Gory, Moscow, 119991, Russian Federation
A.V. Garshev – Lomonosov Moscow State University GSP-1, Leninskie Gory, Moscow, 119991, Russian Federation
E. K. Khrapova – Ioffe Institute Politekhnicheskaya, 26, Saint-Petersburg 194021, Russian Federation
A. A. Krasilin – Ioffe Institute Politekhnicheskaya, 26, Saint-Petersburg 194021, Russian Federation
A.V. Ankudinov – Ioffe Institute Politekhnicheskaya, 26, Saint-Petersburg 194021, Russian Federation; Alexander.ankudinov@mail.ioffe.ru

Ni3Si2O5(OH)4 phyllosilicate nanoscrolls were investigated by two techniques: the bending-based test method of AFM and the indentation method with visual control in STEM. In the first case, the average measured Young’s modulus, about 200 GPa, turned out to be significantly higher than in the second one, 40 GPa. The reasons for this discrepancy are analyzed.

Keywords: AFM, in-situ TEM, nanomechanics, indentation, Young’s modulus.

PACS 07.79.Lh, 87.64.Ee

DOI 10.17586/2220-8054-2021-12-1-118-127

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