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NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2016, 7 (1), P. 140–145

Express analysis of endohedral fullerenes amount contained at fullerene mixture

G. N. Churilov – Kirensky Institute of Physic SB RAS, Krasnoyarsk; Siberian Federal University, Krasnoyarsk, Russia; churilov@iph.krasn.ru
A. A. Popov – Leibniz Institute for Solid State and Materials Research, Dresden, Germany
U. E. Guliaeva – Kirensky Institute of Physic SB RAS, Krasnoyarsk; Siberian Federal University, Krasnoyarsk, Russia
N. A. Samoylova – Leibniz Institute for Solid State and Materials Research, Dresden, Germany
N. G. Vnukova – Kirensky Institute of Physic SB RAS, Krasnoyarsk; Siberian Federal University, Krasnoyarsk, Russia
A. L. Kolonenko – Kirensky Institute of Physic SB RAS, Krasnoyarsk, Russia
V. G. Isakova – Kirensky Institute of Physic SB RAS, Krasnoyarsk, Russia
A. I. Dudnik – Kirensky Institute of Physic SB RAS, Krasnoyarsk; Siberian Federal University, Krasnoyarsk, Russia
V. S. Koravanets – Siberian Federal University, Krasnoyarsk, Russia

This paper describes the technique for rapid determination of endohedral metallofullerene (EMF) content in a fullerene mixture (FM). The methods of mass spectroscopy and atom emission element analysis underlay at the technique. By the method of mass spectroscopy, the type of EMF with atom-guest is registered and by the method of emission spectroscopy, the quantity of that element which is contained in the FM is determined. The technique may be used for rapid determination of EMF weight percents in the FM in the specific case if only one type of EMF is present, and of EMF average content if there are different types of EMF are present. The technique is demonstrated through the example of analysis of FM with Y, which was extracted from the carbon condensate (CC) by different solvents (C₅H₅N and CS₂).

Keywords: endohedral fullerene, atom emission spectroscopy, quantitative assessment.

PACS 32.30; 52.50

DOI 10.17586/2220-8054-2016-7-1-140-145

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