NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2012, 3 (5), P. 33–41
TOPOGRAMS PRODUCTION WITH USE OF PULSED TERAHERZ REFLECTOMETER
Maksim Kulya – Saint Petersburg National Research University of Information Technologies, Mechanics and Optics, Saint Petersburg, Russia, postgraduate, research engineer, Master of Science, maxk2350@yandex.ru
Yaroslav Grachev – Saint Petersburg National Research University of Information Technologies, Mechanics and Optics, Saint Petersburg, Russia, postgraduate, research engineer, Master of Science, gachev_y@mail.ru
Victor Bespalov – Saint Petersburg National Research University of Information Technologies, Mechanics and Optics, Saint Petersburg, Russia, Doctor of Science, Professor, victorbespaloff@gmail.com
It has been considered the possibilities of the experimental setup for temporary registration form of pulsed THz radiation reflected from objects (THz reflectometer) for pulsed terahertz imaging reflectometry and tomography, the visualization of internal objects structures which are transparent in the THz frequency range. It has been received two- and three-dimensional topograms test object and defined resolution limit of the method. It has been found that the space-time registration form of the reflected pulses can effectively generate topograms of surfaces with relief depth ranging from 1 to 1000 microns.
Key words: pulsed teraherz radiation, tomography, reflectometry, flaw detection.
UDC 535-14