16

NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2016, 7 (3), P. 499–501

Synthesis and characterization of highly ordered nanosized PbS thin films: modified silar

Kishorkumar V. Khot – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India; khotkishor7575@gmail.com
Vishvanth B. Ghanwat – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Pallavi B. Patil – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Chaitali S. Bagade – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Rahul M. Mane – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Dadaso B. Shinde – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Sandip K. Jagadale – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India
Jihyung Jang – Nanocrystal Laboratory, School of Energy and Chemical engineering, Ulsan National Institute of Science and Technology (UNIST), South Korea
P. N. Bhosale – Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur, India; p_n_bhosale@rediffmail.com

In the current status, we have successfully synthesized lead sulfide (PbS) thin films using a modified successive ionic layer absorption and reaction (SILAR) method. The synthesized film was characterized using UV-Vis-NIR spectrophotometer, X-ray diffraction (XRD) and field emission scanning electron microscopy (FESEM) techniques for optical, structural and morphological properties. Opto-structural study demonstrates that synthesized thin film has a pure crystal structure. The surface morphology study indicates a nanospherical surface morphology without pinhole on the substrate surfaces. Overall study clearly demonstrates that the synthesized PbS thin film by SILAR method have great potential for sensitization of oxide microstructure.

Keywords: nanomaterials, thin films, SILAR method, XRD, SEM.

PACS 81

DOI 10.17586/2220-8054-2016-7-3-499-501

Download

Leave a Reply

Your email address will not be published. Required fields are marked *

*

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>