NANOSYSTEMS: PHYSICS, CHEMISTRY, MATHEMATICS, 2016, 7 (4), P. 703–706
Structural, optical and morphological study of tungsten selenide thin films
S. Arulmozhi Packiaseeli – P.G. & Research Department of Physics, Fatima College, Madurai, India; firstname.lastname@example.org
V. Rajendran – Department of Physics, Vivekananda College, Madurai, India; email@example.com
R. Vijayalakshmi – P.G. & Research Department of Physics, Thiagarajar. College, Madurai, India
Tungsten selenide (WSe2) film was successfully deposited on FTO substrate by brush plating technique. The film was uniform and well adherent to the substrate and annealed to 300 °C and 500 °C. As the annealing temperature was increased the orientation of the crystallites was more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicates that this film was crystallized in the hexagonal structure.
Keywords: WSe thin film, morphology.
PACS 68.55-a, 74.25 Gz, 64.70ph, 61.05Cp